Scroll Up


Stay up to-date with the latest imaging, analysis and metrology news from Digital Surf.

I agree to receive this newsletter and know that I can easily unsubscribe at any time.
Type the text you see :


What’s inside MountainsSPIP®

Advanced particle analysis
  • Easily detect and quantify features of any shape and size
  • Quantify 70+ characteristics (height, area, volume, perimeter etc.) for the whole sample or individual particles
  • Create classifications and generate statistics on one or several populations
Force spectroscopy
  • View, process and analyze force curves and force volume images
  • Correct data, create interactive parameter maps and manage large collections of curves
  • Calculate adhesion, Young’s modulus, energies, stiffness, WLC etc.
Correlative analysis
  • Combine SPM images with data from other instruments (SEMs, 3D optical microscopes, confocal microscopes etc.) to perform correlative analysis
  • Colocalize with chemical composition data
Multi-channel imaging & analysis
  • Handle multi-channel files
  • Visualize different channels in 3D
  • Apply analysis to a single layer or to all layers
  • Extract multi-layer cross-sections
Automate SPM image analysis
  • Make SPM image analysis faster and more efficient
  • Analyze large batches of data automatically
  • Save your progress and resume your work where you left off
  • Access powerful statistical tools
Data correction & normalization
  • Get your data ready for analysis with correction, normalization & denoising tools
  • Remove anomalous scan lines and isolated artifacts
  • Use FFT-based filtering and thresholding
Lattice & lateral calibration
  • Automatically determine a lattice by detecting a unit cell
  • Calculate correction parameters then apply them to measured data
  • Adjust unit cell detection based on FFT analysis
Tip deconvolution
  • Correct image distortion due to tip convolution
  • Simulate or reconstruct tip geometry and re-use it for the deconvolution of other measured data
Surface texture analysis
  • Characterize surface texture in accordance with international standards
  • Apply advanced ISO 16610 filtering techniques and ISO 25178 3D parameters

Select your product

MountainsSPIP® Premium

MountainsSPIP® Expert

MountainsSPIP® Starter

Instrument compatibility

Any scanning probe microscope (SPM) including atomic force microscopy (AFM), STM, SNOM etc.

Product features

3D views with animation

Advanced File Explorer

Automation (template documents and document save/load features)

Basic correction tools (level, correct lines etc.)

Essential 2D & 3D parameters and filters

Dimensional measurements (step heights, distances etc.)

Full reporting facilities including PDF and Word export

Full set of statistical tools

Tip deconvolution

Image stitching

Optional modules

Detection, analysis and classification of particles and pores


Colocalization (correlative analysis)


IV Spectroscopy


Force curve analysis

Option Option

Contour Analysis


Advanced Contour Analysis


Fiber Analysis

Option Option Option

Scale-sensitive Fractal Analysis

Option Option


Option Option Option

4D Surface Change

Option Option Option
Available as an option
Not compatible

Recommended optional modules

The following range of optional modules for advanced and specialized applications is available for MountainsSPIP® range.

Force Curve Analysis Module

Analyze force spectroscopy data: force curves (force-distance curves) and force volume. Measure adhesion events, nanoindentation and fit WLC models.

Particle Analysis Module

A comprehensive toolset for detecting and analyzing particles, pores, grains, islands etc. on structured surfaces

IV Spectroscopy Module

3D visualization and analysis of IV spectroscopy images and individual IV curve analysis (including CITS data)

Spectroscopy Module

Visualize, process, analyze and correlate spectroscopic data: IR, Raman, TERS, EDS/EDX, XRF and more

Contour Analysis Module

Basic geometric dimensioning & tolerancing of contour profiles & horizontal contours extracted from images & surfaces

Advanced Contour Analysis Module

Advanced dimensioning and tolerancing, DXF CAD-compare, Gothic arch and other advanced functions

4D Surface Change Module

Analyze surface evolution with respect to time, temperature, magnetic field or another dimension

Correlative Microscopy Module

Process spectral maps, correct and enhance spectral image data and perform correlative analysis

Fiber Analysis Module

Analyze fiber morphology including diameter & direction in SEM images (SE and BSE modes), light microscopy images and on topographical data.

Scale-sensitive Analysis Module

Multi-scale methods for analyzing geometric properties of surfaces and their scale derivatives (formerly in Sfrax software)



What People Are Saying

30-day free trial

Free trial

Try Mountains®10 software for free