Surface analysis software trusted by the professionals

Separate roughness and waviness components of surfaces using the latest ISO 16610 advanced filtering techniques.

Access ISO parameters including:

• 3D parameters defined in ISO 25178 including height (Sa, Sq, Ssk, Sku, Sz, etc.,) and functional (Smr, Smc, Sxp) parameters.
• ISO 4287 (and upcoming ISO 21290) primary and roughness parameters (Ra, Rq, Rsk, Rmr, Rdc, Rdq, RPc, etc.).

Calculate & display ASME B46.1 2D and 3D parameters (USA),  GB/T (China), DIN (Germany), JIS (Japan), NF (France), BSI (UK), UNE (Spain) and UNI (Italy) etc.

Perform functional analysis:

• Abbott-Firestone bearing ratio curve and depth distribution histogram.
• Subtraction of one surface from another (wear).
• Calculation of the material/void volume ratio and thickness of up to three vertical slices of a surface.

Normalize surfaces and remove artifacts prior to analysis.  Tools include:

• Leveling.
• Flipping in the horizontal or vertical axis.
• Rotation in one-degree increments.
• Zone extraction.
• Correction or removal of anomalous scan lines.
• Thresholding to remove spikes.
• Retouching of isolated artifacts
• Deconvolution to minimize tip impact on the measurement data.
• Filling in missing data points.
• Surface smoothing.
• Resampling to increase image resolution.

Perform fast and accurate analysis of surface geometry with tools for measuring:

• Distances.
• Angles.
• Areas of peaks and valleys.
• Volumes of bumps and holes.
• Step heights on surfaces and profiles.
• Coplanarity.

• Automatically stitch together multiple measurements that overlap on the horizontal plane – to increase the field of view.
• Interactively patch two or more surface measurements at different heights into a single surface ready for analysis – to increase the vertical range.

• Extract a rectangular or non-rectangular zone.
• Remove a slice from a surface by thresholding.
• Automatically partition a surface into motifs (texture cells), then use the Partition and Level operator to extract a sub-surface and level it.

Once a sub-surface or region of interest has been extracted it can be analyzed in exactly the same way as a full surface – parameters are calculated on the sub-surface only. This makes it possible, for example, to study the roughness, flatness and coplanarity of planes on MEMS and mechanical and electronic components.

• Extract surfaces and parametric profiles from shells
• Visualize surface curvature and deviation as colors in 3D
• Fit a reference form (plan, cylinder, sphere)
• Apply Gaussian-like filtering to calculate a smooth reference surface
• Calculate freeform surface texture parameters
  • Height parameters
  • Hybrid/Spatial parameters
  • Volume parameters
• Extract an area of a shell and analyze it separately

• Extract a vertical (x,z) or horizontal (x,y) contour (profile) from a surface.
• Define nominal form using straightforward interactive tools to associate geometric elements with contours.
• Calculate dimensions (including distances, radii, diameters and angles) using autodimensioning and interactive tools.
• Compare measured contours with CAD data (DXF) or user-defined nominal form.
• Specify tolerances including large positional tolerances if required.
• Visualize form deviations easily with magnified graphics.
• Automatically generate a table of results including pass/fail status.
• Gothic arch analysis of bearings.

Particle Analysis:

• Automatically detect and count grains, particles, islands, bumps, holes and motifs (texture cells) using multiple detection methods.
• Sort particles into groups using several criteria, visualize classes graphically in real-time, create control charts, histograms, scatter plots etc.

• 3D surface topography data and images from different instruments (SEM, AFM etc.) can be colocalized to highlight surface features
• Overlay images on 3D topography (z axis in height units) or on pseudo 3D images (z axis in intensity units)
• Access a wide range of rendering options and set overlay transparency levels.