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Analyze roughness and calculate surface texture parameters according to ISO 25178, ISO 4287, ISO 13565, ISO 21920 etc. and other national standards
Roughness and ISO parameters
Separate roughness and waviness components of surfaces using the latest ISO 16610 advanced filtering techniques.
Access ISO parameters including:
Calculate & display ASME B46.1 2D and 3D parameters (USA), GB/T (China), DIN (Germany), JIS (Japan), NF (France), BSI (UK), UNE (Spain) and UNI (Italy) etc.
Perform functional analysis:
Prepare your measured data for analysis by removing outliers, local defects and noise.
Data correction
Normalize surfaces and remove artifacts prior to analysis. Tools include:
Analyze surface geometry: calculate distances, areas, step heights, volumes and much more.
Surface geometry
Perform fast and accurate analysis of surface geometry with tools for measuring:
Increase profilometer range. Use stitching to expand range of all axes (including Z) and overcome instrument limitations.
Surface stitching
Extract and analyze regions of interest, then study them in the same way as complete measured surfaces.
Sub-surface analysis
Once a sub-surface or region of interest has been extracted it can be analyzed in exactly the same way as a full surface – parameters are calculated on the sub-surface only. This makes it possible, for example, to study the roughness, flatness and coplanarity of planes on MEMS and mechanical and electronic components.
Shell (freeform surface) analysis
Apply complete geometric dimensioning and tolerancing (GD&T) analysis. Fit elements, calculate deviations and dimensions, compare with CAD models.
Advanced contour analysis
Carry out advanced surface texture analysis with Particle Analysis, Fourier & Wavelets and 4D analysis (surface evolution analysis over time etc.)
Particle analysis and more
Particle Analysis:
Perform correlative analysis and co-localize data from any profiler or microscope all with the same software.
Correlative analysis
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Instrument compatibility |
All profile and areal measuring instruments |
All profile and areal measuring instruments |
Areal optical profilers producing topography maps together with an intensity image and/or a color image
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Suitable for areal optical or contact stylus profilometers producing topography maps
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2D contact or optical profilometers |
Profile roughness and waviness analysis |
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Basic analysis of surface data |
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Stitching of images and surfaces, outlier removal & multifocus reconstruction |
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Support for file formats from optical profilers |
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Automotive parameters, advanced filters |
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Advanced analysis tools (Profilometry) |
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Exhaustive list of parameters for surface texture analysis |
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Support for time-series of surfaces and freeform surfaces (shells) |