One analysis software solution for all your instrument data

Bring together data from multiple instruments

• Speed up analysis by using one single software program
• Ensure you are generating meaningful results from your data

Load live documents and analyses created by other Mountains® users (22,000+ community worldwide)

Process data from virtually any type of surface and image analysis instrument (50+ instrument manufacturers provide Mountains®-based software packages with their equipment)

Process data from:

• 2D and 3D profilometers
• light microscopes & other imaging systems producing monochrome images or color images
• scanning electron microscopes (SEM)
• scanning probe microscopes (SPM) including atomic force microscopes (AFM)
• spectroscopic techniques (Raman, TERS, IR, nanoIR, fluorescence, photoluminescence, cathodoluminescence, EDX/EDS, XRF etc.)

Load hundreds of file formats covering:

• profiles
• surfaces
• 3D (tomography) and 2D images
• multi-channel files
• force curves
• hyperspectral images
• multi-channel cubes etc.

• Perform correlative analysis quickly and easily
• Use the MountainsLab® colocalization feature to combine and overlay images and other data from different instrument types
• Access advanced rendering options including image correction, color mixing and transparency to highlight image features

• Benefit from Digital Surf’s 30+ year expertise in surface metrology
• Use application-specific tools for analyzing surface texture
• Access advanced filters, parameters and other tools for profiles, surfaces and series of data

• Detect and quantify particles, pores, grains and other features of any shape and size on any surface and from any instrument
• Accurately measure fibers and interstices (fiber diameter, fiber orientation etc.)
• Benefit from application-oriented segmentation techniques dedicated to your instrument type (profiler, SEM-SE, SEM-BSE, multi-channel data etc.)
• Group particles into classes based on characteristics
• Generate statistics and graphics (scatter plot, box plot, control chart, histogram etc.)

• Generate statistics for static or dynamic data populations
• Create statistics reports and let MountainsLab® detect and update data automatically
• Graphically display data by using control charts, histograms, scatter plots and more

• Automatically generate dimensions of profiles
• Compare profiles with CAD data in DXF format or user-defined nominal form
• Use tolerancing tools to apply pass/fail criteria
• Display form deviation graphically
• Export results in Excel-compatible format for quality management systems
• Process profiles with variable dimensions
• Perform Gothic Arch analysis

• Analyze force curves and force volume obtained by atomic force microscopes
• Automatically preprocess and denoise force curves, normalize baselines and calibrate cantilever sensitivity
• Visualize force curves: display single attract and/or retract curves and series of curves, select axis units
• Detect adhesion force adhesion events and calculate parameters, with manual fine tuning
• Apply Wormlike chain (WLC) models for protein unfolding
• Generate Young’s Modulus map
• Create statistics for series of force curves

• Visualize and analyze spectra and spectral maps from Raman, cathodoluminescence & photoluminescence techniques
• Visualize and analyze hyperspectral images
• Correlate data from spectroscopy with data and images from other instruments (AFM, SEM etc.) including topography data if available
• Load multi-channel cubes of compositional data (“chemical” cubes)

Colorizing your SEM images can aid visualization and interpretation of the information they contain, as well as making them more aesthetically pleasing for publication
purposes.

• One click of the mouse is enough to color an object in your image.
• Objects are detected automatically. No need to create layers or play with transparency levels. MountainsLab® does the work for you.
• Use the same software for image processing & analysis. Once you’ve colorized your image in MountainsLab®, making objects easier to see, you have access to a comprehensive range of tools to carry out different types of analysis: 3D reconstruction, surface geometry analysis, surface roughness measurement

• Reconstruct heights from two successive tilted scans of your sample using stereo photogrammetry reconstruction algorithms
• Reconstruct heights from a four-image scan by a four-quadrant backscattered electron detector  using shape from shading algorithms
• Get approximate 3D rendering from a single image
• Access tools for roughness analysis and 3D dimensional analysis

• Access tutorials and ready-to-use templates adapted to each different instrument type (2D/3D profilometer, light microscope, SEM, SPM, spectroscopic techniques)
• Easily teach new colleagues about surface and image analysis routines using illustrated and commented templates