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⇒ Combine surface data from different instrument types including 3D optical profilers, atomic force microscopes, scanning tunneling microscopes, scanning electron microscopes, fluorescence, Raman, IR & other microscopes.

⇒ Colocalize images from different instruments /detectors.

⇒ Overlay images on 3D surface topography – view 3D overlays at any zoom level and angle.

Convert color and grayscale images into 3D colored pseudo-surfaces (Z-axis in intensity units).