One software program for all your measured data
Process data from any surface measuring instrument all in one place:
- SEM images including EDX/EDS data
- AFM & other SPM images
- Spectral data from Raman, fluorescence, IR, XPS, cathodoluminescence etc.
- 2D profiles or 3D surface heights
Learn more about Mountains® software key features in our video presentation:
See example applications:
Correlating AFM, SEM & EDX data for nanoparticle analysis
Mountains® sofware used to combined measurements from several instrument techniques including AFM, SEM and EDX.
Exploring hyperspectral maps of 2D materials
Hyperspectral maps and advanced principal component analysis (PCA) were performed with Mountains® software.
Analyzing photoelectron spectroscopic measurements
Mountains® software combined with photoelectron spectroscopy to investigate a new method for growing PbS nanoplatelets on InP surfaces.
Characterizing the silicon dangling bond
Research scientists used Mountains® software to understand the electronic properties of silicon dangling bonds.
Failure analysis in optoelectronic devices
Quantitative CL technology coupled with Mountains® software makes it possible to identify degraded layers in green laser diodes.
- Discover full features of MountainsLab® for multi-instrument compatibility
- About Digital Surf