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Stay up to-date with the latest imaging, analysis and metrology news from Digital Surf.

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MountainsLab® for multi-instrument compatibility

Ultimate surface analysis suite and point of confluence for data from any kind of instrument, the ideal solution for labs working with multiple types of microscopes

MountainsMap® for Profilometry

Surface analysis software for 3D optical profilers measuring topography, scanning 3D surface profilometers using contact or non-contact techniques and 2D profilometers

MountainsSEM® for Scanning Electron Microscopy

Visualization and analysis software for scanning electron microscopes (SEM) with tools for 3D reconstruction, colorization, particle analysis & FIB-SEM tomography

MountainsSPIP® for Scanning Probe Microscopy

Analysis software for scanning probe microscopy techniques including atomic force microscopy (AFM) and STM, MFM, SNOM, CSAFM, KPFM, etc.

MountainsSpectral® for Spectroscopy

Data processing and correlative analysis software for spectroscopic techniques (Raman, TERS, IR, nanoIR, fluorescence, photoluminescence, cathodoluminescence, EDX/EDS, XRF etc.)

MountainsImage® for Light Microscopy

Image visualization & analysis software for light microscopes and other imaging systems producing B&W or color images without topography

News

January 10, 2024

Learn more about particle analysis using Mountains® software in the second episode of our webinar series.

Event

24 February

We are thrilled to be exhibiting at the next Pittcon conference from February 26 to 28 in San Diego, CA, USA.

Digital Surf has been developing surface imaging & metrology software for profilers and microscopes since 1989

Our main focus is on working as a partner with instrument manufacturers worldwide, in the fields of surface metrology and microscopy. Mountains® software is now offered by the majority of profilometer and microscope manufacturers and is embedded in their equipment or available as an option.

Digital Surf also provides Mountains® software packages directly to instrument users. Mountains® has an installed base of 22,000+ licenses worldwide, is available in 11 languages, supports ISO and national metrology standards and is supplied by 50+ instrument manufacturers.

Application areas include: automotive, materials science, semiconductors, medical, aerospace, MEMS, renewable energy, etc.

Stories

AFM image analysis: determining surface quality of cap layers in superconductors

Researchers at the Institut de Ciència de Materials de Barcelona characterizied surface texture of superconductor materials with the aim of improving their performance.

Imaging fish scale topography in situ

Researchers at Purdue and Harvard universities explored fish scale surfaces in 3D using MountainsMap® software.

Learn surface metrology

Dive into our free online surface metrology guide and learn how to characterize surface texture in 2D and 3D using the right parameters and filters

Blog

What is spectral analysis?

November 23, 2023

In this article François Blateyron, senior surface metrology expert at Digital Surf, discusses spectral analysis and why it is key to understanding surface texture analysis.