AFM & SPM analysis software from the experts

• Detect and quantify particles, pores, grains and other features of any shape and size on any surface
• Benefit from application-oriented segmentation techniques
• Group particles into classes based on characteristics
• Generate statistics and graphics (scatter plot, box plot, control chart, histogram etc.)

Read our article here to learn more. 

• Visualize force curves and automatically pre-process with denoising, normalization and calibration tools
• Automatically detect adhesion events and calculate parameters
• Calculate Young’s modulus, energies, stiffness, etc.
• Generate wormlike chain (WLC) models
• Analyze series of force curves and generate statistics (control charts, scatter plots, histograms) on any parameter
• Visualize force volume data & display interactive parameter maps
• Filter force volume and extract slices or individual force curves interactively

• Combine SPM images with data from other instruments (SEMs, 3D optical microscopes, confocal microscopes etc.) to perform correlative analysis.
• Overlay high-resolution topography images acquired with an atomic force microscope (AFM) on RGB images acquired by a microscope with a larger field of view (SEM, fluorescence, optical images).
• Colocalize with chemical composition (spectroscopy) data

Left: colocalization of an SEM image with AFM topography.

Scanning probe microscopes commonly image several interactions simultaneously. Through their different modes, SPMs produce multiple datasets at the same location on the sample (topography, conductivity or stiffness for example).

• Handle multi-channel images as easily and as efficiently as if they were dealing with a simple topography image
• Visualize different channels in 3D at the touch of a button
• Apply analysis to a single channel or to all channels
• Extract multi-channel cross-sections
• Explore correlations between the different channels

Learn more: digitalsurf.revelateur.fr/news/multi-channel-data-how-to-study-correlations/

• Streamline your analysis process and boost efficiency with no-code automation tools
• Efficiently analyze large batches of data by saving and reapplying analysis sequences automatically
• Save your progress and resume your work seamlessly
• Enhance your analysis with powerful built-in statistical tools

Correction of anomalous scan lines and measurement artifacts

• Automatic line-by-line correction followed by leveling, ignore structures above the surface (bumps) and below the surface (holes).
• Individual line correction by interpolation
• Retouch to remove isolated artifacts.
• Threshold etc.

Normalization

• Surfaces can be leveled, flipped in the horizontal or vertical axis and rotated in one degree increments prior to analysis.
• Zones on surfaces can also be extracted for independent study.

Denoising filters

• Spatial filters with configurable matrices
• FFT plot editor

• In images with regular patterns, determine a lattice by detecting a unit cell and quantify its dimensions
• Quantify scaling and linearity errors
• Use these values as correction factors to correct the linearity and the scaling of other surfaces

Correct the effect of the tip on the measured surface.

• Simulate tip geometry
• Estimate tip geometry using Villarrubia’s “Blind reconstruction” method
• Save tip geometry and re-use it for the deconvolution of other surfaces

• Seperate roughness and waviness components of surfaces using the latest ISO 16610 advanced filtering techniques, including robust Gaussian and spline filters.
• Access ISO parameters: ISO 25178 height (Sa, Sq, Ssk, Sku, Sz, etc.,) and functional (Smr, Smc, Sxp) parameters, ISO 4287 primary and roughness parameters (Ra, Rq, Rsk, Rmr, Rdc, Rdq, RPc, etc.) and more.