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Easily detect and quantify features of any shape and size. Quantify 70+ characteristics (height, area, volume, perimeter etc.) for the whole sample or individual particles.
Advanced particle analysis
Easily detect and quantify features of any shape and size. Quantify 70+ characteristics (height, area, volume, perimeter etc.) for the whole sample or individual particles.
View, process and analyze force curves and force volume images. Correct data, create interactive parameter maps and manage large collections of curves.
Force spectroscopy
View, process and analyze force curves and force volume images. Correct data, create interactive parameter maps and manage large collections of curves.
Combine SPM images with data from other instruments (SEMs, 3D optical microscopes, confocal microsopes etc.) to perform correlative analysis.
Correlative analysis
Combine SPM images with data from other instruments (SEMs, 3D optical microscopes, confocal microsopes etc.) to perform correlative analysis.
Handle multi-channel files. Visualize different layers in 3D at the touch of a button. Apply analysis to a single layer or to all layers. Extract multi-layer cross-sections.
Multi-channel imaging & analysis
Handle multi-channel files. Visualize different layers in 3D at the touch of a button. Apply analysis to a single layer or to all layers. Extract multi-layer cross-sections.
Process data from any brand or type of scanning probe microscope including atomic force microscopy (AFM), STM, SNOM etc. Open over 170 file formats.
High compatibility
Process data from any brand or type of scanning probe microscope including atomic force microscopy (AFM), STM, SNOM etc. Open over 170 file formats.
Get your data ready for analysis with correction, normalization & denoising tools. Remove anomalous scan lines and isolated artifacts.
Data correction & normalization
Get your data ready for analysis with correction, normalization & denoising tools. Remove anomalous scan lines and isolated artifacts.
Lateral calibration: automatically calculate correction parameters (for example using a calibration standard) then apply them to measured data.
Lateral calibration
Lateral calibration: automatically calculate correction parameters (for example using a calibration standard) then apply them to measured data.
Correct image distortion due to tip convolution. Simulate and reconstruct tip geometry and re-use it for the deconvolution of other measured data.
Tip deconvolution
Correct image distortion due to tip convolution. Simulate and reconstruct tip geometry and re-use it for the deconvolution of other measured data.
Characterize surface texture characterization in accordance with international standards. Apply advanced ISO 16610 filtering techniques and ISO 25178 3D parameters.
Surface texture analysis
Characterize surface texture characterization in accordance with international standards. Apply advanced ISO 16610 filtering techniques and ISO 25178 3D parameters.
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Instrument compatibility |
Any scanning probe microscope (SPM) including atomic force microscopy (AFM), STM, SNOM etc. |
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3D View with animation |
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Advanced File Explorer |
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Automation using Template Documents and document save/load features |
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Basic tools for SPM image visualization and analysis |
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Dimensional measurements (step heights, distances) |
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Full reporting facilities including PDF and Word export |
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Detection, analysis and classification of particles and pores |
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Powerful statistical tools |
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Tip deconvolution |
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Analysis of force curves |
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Colocalization (correlative analysis) |
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Image stitching |