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One analysis software solution for all your instrument data

The ideal solution for labs working with all types of microscopes and profilers, MountainsLab® software is the ultimate, industry-standard surface analysis suite and point of confluence for all your instrument data. You can count on our team’s extensive expertise to ensure successful analysis, whatever your application.
The most comprehensive set of form and surface texture analyses - Particle and pore analysis - Statistical analysis of static and dynamic populations - Force curve and force volume analysis - Features for spectroscopy (Raman & IR spectrometers, EDS/EDX, IV Spectroscopy etc.) - Color and topography innovation for scanning electron microscopy - And much more

What’s inside MountainsLab®

Data confluence

Bring together data from multiple instruments, speed up analysis by using one single software program and ensure you are generating meaningful results from your data
Load live documents and analyses created by other Mountains® users (20,000+ community worldwide)
Process data from virtually any type of surface and image analysis instrument (50+ instrument manufacturers use Mountains ®)

Compatible with any instrument

Process data from 2D and 3D profilometers, scanning electron microscopes (SEM), scanning probe microscopes (SPM)/atomic force microscopes (AFM) and spectroscopic techniques
Load hundreds of file formats covering profiles, surfaces, 3D (tomography) and 2D images, multi-channel files, force curves, hyperspectral images, multichannel cubes, etc.

Correlative analysis

Perform correlative analysis quickly and easily
Use the MountainsLab® colocalization feature to combine and overlay images and other data from different instruments
Access advanced rendering options including image correction, color mixing and transparency to highlight image features

Surface texture analysis

Benefit from Digital Surf’s 30+ year expertise in surface metrology
Use application-specific tools for analyzing surface texture
Access advanced filters, parameters and other tools for profiles, surfaces and series of data

Advanced particle analysis

Detect and quantify particles, pores, grains and other image features of any shape and size on any surface and from any instrument
Benefit from application-oriented segmentation techniques dedicated to your instrument type (profiler, SEM-SE, SEM-BSE, multichannel data etc.)
Group particles into classes based on characteristics
Generate statistics and graphics (scatter plot, box plot, control chart etc.)

Generate statistics

Generate statistics for static or dynamic data populations
Create statistics reports and let MountainsLab® detect and update data automatically
Graphically data by displaying control charts, histograms, scatter plots and more

Advanced contour analysis

Automatically generate dimensions of profiles
Compare profiles with CAD data in DXF format or user-defined nominal form
Graphically display form deviations

Force spectroscopy

Analyze force curves and force volume
Detect adhesion force, apply Wormlike chain (WLC) models for protein unfolding, generate Young’s Modulus map etc.

Data processing for spectroscopic techniques

Visualize and analyze spectral maps from Raman, cathodoluminescence & photoluminescence techniques
Visualize & analyze hyperspectral images
Correlate data from spectroscopy with data and images from other instruments (AFM, SEM etc.) including topography data if available
Load multichannel cubes of compositional data (“chemical” cubes)
Carry out particle analysis

SEM image colorization

Add color to objects in SEM images in just a few clicks
Automatic object detection
Save time compared with using photo editing software

3D SEM image reconstruction

Generate 3D surface topography from two successive tilted scans of your sample or 4 images scanned by a 4-quadrant detector
Get approximate 3D rendering from a single image
All in a matter of seconds

Learn & teach

Access tutorials and ready-to-use templates adapted to each different instrument type
Easily teach new colleagues about surface and image analysis routines using illustrated and commented templates

Mountains® core features

Powerful automation

Automate your repetitive work and speed up your analysis process
Save analysis sequences and reapply automatically to large batches of data
Accelerate analysis with built-in statistics tools

Mountains® core features

Scientific software with a document layout

Organize the different steps of your image processing (original images, distance measurements, particle statistics etc.) on one or several pages
Publish these directly in different formats (PDF, Word and Excel) to share with colleagues, students, clients etc.

Mountains® core features

Interactive workflow

MountainsLab® unique analysis workflow lets users see all the analysis steps already applied to data
Revert back to any step in the process at any time
Workflow is interactive

Mountains® core features

Trusted by the manufacturers

Process data from any brand or type of profilometer or microscope
Join over 20,000+ Mountains® users worldwide
Use image analysis software chosen & provided by the leading manufacturers
The majority of national research laboratories trust the precision of Mountains® (NIST, NPL, PTB, LNE etc.)

Mountains® core features

Work & get help in your own language

Work in one of the 11 languages available in the Mountains® user interface
Get help on using the software for your applications from our international support team

Select your product

	MountainsLab® Premium	MountainsLab® Expert
Instrument compatibility	All types of surface measuring and imaging instrument: 2D/3D profilometer, scanning electron microscopes, scanning probe microscopes etc.
Correlative Analysis tools
Particle and pore analysis for surface and image data
SEM image colorization & 3D reconstruction from stereo or quad SEM images
Statistical analysis of static and dynamic populations
Automotive parameters, advanced filters, parameters
Ultimate set of 2D & 3D surface texture parameters
Force curve and force volume analysis and features
Advanced Contour Analysis
Spectroscopy data
FIB-SEM tomography
Multichannel cubes
Shell analysis

Get a quote

Recommended optional modules

The following range of optional modules for advanced and specialized applications is available for MountainsLab® range.

Advanced Topography Module

Advanced studies, parameters & filters for 3D (“areal”) surface texture analysis

IV Spectroscopy Module

Analysis and 3D visualization of IV spectroscopy images and individual IV curve analysis (including CITS data)

Advanced Profile Module

Advanced profile filtering, fractal and Fourier analysis, statistical analysis of series of profiles

Stories

Correlating AFM, SEM & EDX data for nanoparticle analysis

For this application, a research team at the LNE Nanotech Institute combined measurements from several instrument techniques including Atomic Force Microscopy (AFM) and Scanning Electron Microscope (SEM) equipped with a new-generation energy dispersive X-ray detector (EDX). They used MountainsLab® software to correlate the collected data and extract the relevant information.

Characterizing the silicon dangling bond

Bruno Grandidier, research scientist with the French National Center for Scientific Research (CNRS), reports on his work, focused on understanding the electronic properties of silicon dangling bonds.

Uncovering the huge potential of graphene oxide membranes

Recently, graphene oxide nanostructures have attracted great interest due to their exceptional physicochemical properties for many applications, including flexible electronics and water purification.

Bio-fuels research – fat stored in bacteria

During the last decade, research has shown that bio-oil fermentation by micro-organisms is a promising potential source of bio-fuel. Its renewability makes it a good alternative to bio-fuel production.

Analyzing roughness of glass subjected to acid attacks

The goal of the NanoRef programme, involving multiple partners (LP-Cnam, INM, LPUB, Institut Fresnel, Novasic and LNE), is to develop a roughness standard with a quasi-continuum spatial frequency spectrum and to define the appropriate machining and polishing processes.

Testimonials

What People Are Saying

Dr Claudiu Giusca

Senior Lecturer in Sensor Technology for Precision In-process Measurement, Cranfield University

Mountains® is able to read specific files from different instrument manufacturers meaning it allows us to compare the results within the same visual platform. We like how results are visualized and when it comes down to applying your operators, the software is intuitive.

Peter Van Rompuy

Primary Lab Technician, Agfa-Gevaert

Superb software and great support!

In my opinion, Mountains® is the way to go if you want to raise the bar and get the most out of your topographic datasets.

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Try Mountains®8 software for free (Mountains®9 available early June)

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