Newsletter
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Data confluence
Compatible with any instrument
Correlative analysis
Surface texture analysis
Advanced particle analysis
Generate statistics
Advanced contour analysis
Force spectroscopy
Data processing for spectroscopic techniques
SEM image colorization
3D SEM image reconstruction
Learn & teach
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Instrument compatibility |
All types of surface measuring and imaging instrument: 2D/3D profilometer, scanning electron microscopes, scanning probe microscopes etc. |
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Correlative Analysis tools |
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Particle and pore analysis for surface and image data |
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SEM image colorization & 3D reconstruction from stereo or quad SEM images |
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Statistical analysis of static and dynamic populations |
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Automotive parameters, advanced filters, parameters |
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Ultimate set of 2D & 3D surface texture parameters |
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Force curve and force volume analysis and features |
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Advanced Contour Analysis |
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Spectroscopy data |
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FIB-SEM tomography |
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Multichannel cubes |
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Shell analysis |
The following range of optional modules for advanced and specialized applications is available for MountainsLab® range.