“SEM Topography” bridges the gap between scanning electron microscopy data analysis and other Mountains® software products dedicated to profilers or SPMs.
⇒ Ultra-fast 3D reconstruction – reconstruct 3D models of your sample from stereo image pairs, anaglyphs or images generated by 4-quadrant detectors.
⇒ Computer-assisted image coloring – colorize a SEM image in a few clicks thanks to the semi-automatic object segmentation and produce high-quality color images for publications and posters.
⇒ Generate 3D renderings from single SEM images and improve visual interpretation of the image
⇒ High quality imaging – improve image quality with image enhancement tools and denoising filters.
⇒ Distance and angle measurement – measure objects within the image plane.
⇒ Anaglyphs – generate anaglyphs from 3D topography for viewing with stereoscopic glasses.
⇒ Profile (cross-section) extraction – from reconstructed 3D surfaces.
⇒ Contour dimensional analysis of horizontal contours extracted from the XY plane and vertical contours (XZ profiles).
⇒ Subsurface analysis – extract and level planes on surfaces of microelectronic, micromechanical and other components.
⇒ Colocalization for correlative studies – colocalize different SEM images (for example a backscattered electron image with a secondary electron image) – colocalize SEM images with surface topography obtained by other microscopes or profilometers* – overlay images on 3D surface topography*. (* Availability of these functions depends upon what instrument file formats are supported by your software.)
⇒ MATLAB™ compatibility – load or write MATLAB™ scripts and execute them to carry out custom operations including filtering.